XRD

$X-ray Diffraction$

Department of Chemistry
Colorado State University
Fort Collins, CO 80523
FAX: (970) 491-1801

Bruker D-8 Discover and Scintag X-2 Advanced Diffraction X-ray Cabinet system are used routinely to provide x-ray solutions for structural analysis of powder and thin film samples. Both the cabinet X-ray systems uses CuKa radiation source. Scintag X2 is equipped with Pelteir Detector with stationary sample stage. The Scintag X2 is extremely useful to qualitative and quantitative analysis of Powder samples.
Bruker D-8 Discover equipped with parabolic Göbel mirror for parallel and monochromatic beam and ¼-circle Eulerian cradle provides the precise and non-destructive analysis of thin film and multi-layered structures. Equipped with 4-Bounce monochromator and Analyzer Crystals X-ray Diffraction facilities It is capable of
Double and Triple Axis High Resolution X-ray Diffraction (HRXRD) to determine chemical composition, lattice spacing and mismatches, layer thickness for your high quality epitaxial layers.
High-resolution X-ray Reflectivity (XRR) to determine thickness, density or roughness of thin film and multilayers.
Glancing Angle X-ray Diffraction measurements at low incident angles to maximize the signal from the thin layers as well as depth profiling of the phase composition of layered
Residual Stress and Texture Analysis of thin films.