Application Resources: Materials Science

• X-ray Photoelectron and Auger Electron Spectroscopy

• X-ray Diffraction

• Thermal Analysis

• FTIR and Raman

• UV-VIS-NIR Spectroscopy

• Spectroscopic Ellipsometry

• Electron Microscopy

• Magnetometer

• X-ray Photoelectron and Auger Electron Spectroscopy

• NIST XPS Database

• XPS Peak– A software for fitting XPS Peak

• National ESCA and Surface Analysis Center for Biomedical Problems at University of Washington

• UK Surface Analysis Forum Database of Auger Parameter Energies

• XPS/AES Tables

• Accurel XPS/AES Tutorial

• LA Surface XPS,AES,UPS and ESCA

• Surface Analysis Forum Surface Science Site
  

• X-ray Diffraction

  Handouts from C563C Class

  • Glancing Angle X-ray Diffraction

  • X-ray Reflectivity

  • High Resolution X-ray Diffraction

  • Residual Stress Suggested Readings

• High Resolution X-ray Scattering from Thin Films and Multilayers,V. Holy, U. Pietsch, T. Baumbach, Springer Tracts in Modern Physics

• Residual Stress Measurements by Diffraction and Interpretation , I.C. Noyan, J.B. Cohen, Springer-Verlag

• High Resolution X-Ray Diffractometry and Topography D. K. Bowen , B. K. Tanner, Taylor and Francis

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• Thermal Analysis

• TA training presentations on DSC at CSU

• TA training presentations on TGA-MS at CSU

• FTIR and Raman

  • More information on FTIR and Raman

  • Infrared Spectral Interpretation, A systematic approach, Brian Smith, CRC Press

  • Practical Fourier Transform Infrared Spectroscopy, Industrial and Laboratory Chemical Analysis. Eds ( John R. Ferraro & K. Krishnan) Academic Press

  • An Introduction to Raman Spectroscopy: Introduction and Basic Principles (on www.Spectroscopynow.com

  • SpectroscopyNOW.com: An online resource for spectroscopy

  • Society for Applied Spectrocopy

  • NIST Chemistry WebBook
    
    
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• UV-VIS-NIR Spectroscopy

  • More information on UV-VIS-NIR Accessories

  • Trace Analysis Spectroscopic Methods for molecules, Eds. Gary D. Christian and James B. Callis, John Wiley & Sons

• Spectroscopic Ellipsometry

  • Woollam, John A.; Hilfiker, James N.; Bungay, Corey L.; Synowicki, Ron A.; Tiwald, Thomas E.; Thompson, Daniel W. Spectroscopic ellipsometry from the vacuum ultraviolet to the far infrared. AIP Conference Proceedings (2001), 550 (Characterization and Metrology for ULSI Technology), 511-518.

  • Jenkins, T. E. Multiple-angle-of-incidence ellipsometry. Journal of Physics D: Applied Physics (1999), 32(9), R45-R56.

  • Vedam, K. Spectroscopic ellipsometry: a historical overview. Thin Solid Films (1998), 313-314 1-9

  • Woollam, John A.; Snyder, Paul G. Fundamentals and applications of variable angle spectroscopic ellipsometry. Materials Science & Engineering, B: Solid-State Materials for Advanced Technology (1990), B5(2), 279-83.

  • Collins, Robert W.; Kim, Yeon Taik. Ellipsometry for thin-film and surface analysis. Analytical Chemistry (1990), 62(17), 887A-890A, 893A-900A.
    
    

• Quantum Design Service Notes

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